From ba19e177301a64e00f73d31513282378dade98a9 Mon Sep 17 00:00:00 2001 From: "David Lechner (TI)" Date: Tue, 14 Jul 2026 18:21:26 -0500 Subject: [PATCH] dt-bindings: iio: adc: add input-chopping property Add a generic input-chopping property to adc.yaml. This is a feature seen frequently in ADCs that are designed to measure resistive loads, such as RTDs and strain gauges. Enabling this can reduce offset errors by swapping the positive and negative input channels on every other conversion. This can have side-effects in timing and filter response, so it is not always desirable to enable this feature in some applications. Therefore, it is best to make this a property that can be enabled or disabled in the device tree. Signed-off-by: David Lechner (TI) Acked-by: Conor Dooley Signed-off-by: Jonathan Cameron --- Documentation/devicetree/bindings/iio/adc/adc.yaml | 8 ++++++++ 1 file changed, 8 insertions(+) diff --git a/Documentation/devicetree/bindings/iio/adc/adc.yaml b/Documentation/devicetree/bindings/iio/adc/adc.yaml index e1da63119648..b673eaa5d072 100644 --- a/Documentation/devicetree/bindings/iio/adc/adc.yaml +++ b/Documentation/devicetree/bindings/iio/adc/adc.yaml @@ -80,6 +80,14 @@ properties: ADCs usually allow choosing between internal reference sources or a pair of external pins. + input-chopping: + type: boolean + description: + If set, the positive and negative input channels are swapped on every + other conversion to reduce offset error. This generally comes at the + expense of added settling time between conversions, so should be omitted + on systems with high-frequency signals or high data rate requirements. + excitation-channels: $ref: /schemas/types.yaml#/definitions/uint32-array description: